This Intel white paper details how natural language processing and sentiment analysis are transforming failure mode and effects analysis (FMEA) in semiconductor manufacturing. Traditionally requiring weeks of manual log review, the new AI-driven method reduces the process to seconds by analyzing technician notes, tool logs, and SPC data for sentiment indicators like “fail” or “alarm.” Integrated into Intel’s Data on the Spot (DOTS) analytics platform, the system enables engineers to trace issues to root causes interactively via Pareto charts and dashboards. Tested on etch processes, it identified all failures found manually plus additional ones, cutting weeks of effort to under a minute and freeing engineers to focus on innovation.

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