Case Study
pcIE Gen 3 Probing
ACS #0010 Application Case Study w w w.ardentconcepts.com pcIE Gen 3 Probing The IC Manufacturer worked with Ardent to design an easy to use, step-able Cartesian Coordinate based IC Footprint probe which was capable of making direct contact with these signal locations and allowing connection to instrumentation for de-embedding and de-bugging the CBB. This solution greatly increased the customer’s confidence in the design of their IC and will result in a faster release to market. The Ardent Solution • Time saving alternative to expensive X-Y tables and fragile planar probes • Probe multiple signals at once • Step-able for precise probing without a microscope Key Benefits A major IC Manufacturer was developing a new PCIE device and needed a repeatable way to de-embed the signal l