Veeco Uses Galil’s Modular Ability to “See” Sub-Nano Flaws

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An increasing number of modern technologies require more and more sophisticated metrology to measure ever-finer details and tighter tolerances. Veeco’s new Wyko® Optical Profilers, directed by a series of Galil motion controllers, provide non- contact, three-dimensional measurement of sur- face roughness and topography, with sub- nanometer resolution. The measurements are accurate, repeatable and high speed. Veeco chose Galil’s Ethernet-based DMC

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Case Study

Veeco Uses Galil’s Modular Ability to “See” Sub-Nano Flaws

Veeco Uses Galil’s Modular Ability to “See” Sub-Nano Flaws

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