Micro-XRF for non destructive analysis of museum and archaeological objects The XGT-5000 is ideally suited for analysis of archaeology specimens and museum objects. Key features of the instrument for this research include: • non-destructive sampling - delicate and fragile artifacts can be analysed at atmospheric pressure without risk of damage. Single point, automated multi-point and XY mapping analysis ensures versatility in sampling. • ultra-narrow x-ray beam - even small and intricate features, down to 10 µm in size can be interrogated. For flexibility, both micro and macro beams can be accommodated on the same instrument. Switching between beams is fast and easy, and requires no operator alignment. • large area analysis - areas up to 20 cm x 20 cm can be routinely mapped out,

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