Developing Versatile Test System to reduce Semiconductor Cost of test
Developing Versatile Test System to reduce Semiconductor Cost of test
4 Pages1/4 www.ni.com Developing a Versatile Test System to Reduce Semiconductor Cost of Test Author(s): Roger Cagliesi - SYNERGIE CAD INSTRUMENTS Massimiliano Giancarlini - SYNERGIE CAD INSTRUMENTS Marco Salvi - SYNERGIE CAD INSTRUMENTS Lorenzo Strabla - SYNERGIE CAD INSTRUMENTS The semiconductor Cost of Test (CoT) depends on the Overall Equipment Efficiency (OEE), which takes into account both the automated test equipment (ATE) uptime and the avail
